Characterization of traps in InAlN by optically and...

Journal of Applied Physics 2018 / 10 Vol. 124; Iss. 14

Characterization of traps in InAlN by optically and thermally stimulated deep level defect spectroscopies

Farzana, Esmat, Foronda, Humberto M., Jackson, Christine M., Razzak, Towhidur, Zhang, Zeng, Speck, James S., Arehart, Aaron R., Ringel, Steven A.
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Volume:
124
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5050949
Date:
October, 2018
File:
PDF, 1.56 MB
english, 2018
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