![](/img/cover-not-exists.png)
[IEEE 2017 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Washington, DC (2017.10.10-2017.10.12)] 2017 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Texture Classification using Multiple Local Descriptors
Oraibi, Zakariya A., Irio, Morgane, Hafiane, Adel, Palaniappan, KannappanYear:
2017
Language:
english
DOI:
10.1109/AIPR.2017.8457968
File:
PDF, 2.99 MB
english, 2017