Failure of Switching Operation of SiC-MOSFETs and Effects of Stacking Faults on Safe Operation Area
Fujita, Ryusei, Tani, Kazuki, Konishi, Kumiko, Shima, AkioVolume:
65
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2018.2864305
Date:
October, 2018
File:
PDF, 3.33 MB
english, 2018