Extraction of Junction Temperature of SiC MOSFET Module Based on Turn-On dIDS/dt
Huang, Delei, Tan, Guojun, Geng, Chengfei, Zhang, Jingwei, Liu, ChangVolume:
11
Language:
english
Journal:
Energies
DOI:
10.3390/en11081951
Date:
July, 2018
File:
PDF, 6.99 MB
english, 2018