![](/img/cover-not-exists.png)
[IEEE 2018 19th International Conference on Electronic Packaging Technology (ICEPT) - Shanghai, China (2018.8.8-2018.8.11)] 2018 19th International Conference on Electronic Packaging Technology (ICEPT) - Phase field study of the combined effects of electromigration and thermomigration on phase segregation and physical properties of Sn58Bi solder joints under electric current stressing coupled with temperature gradient
Liang, Shui-Bao, Ke, Chang-Bo, Wei, Cheng, Zhou, Min-Bo, Zhang, Xin-PingYear:
2018
Language:
english
DOI:
10.1109/ICEPT.2018.8480529
File:
PDF, 12.92 MB
english, 2018