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[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Study of Biased Temperature Instabilities in LDMOST technologies
Tao, Guoqiao, Koster, R., Romanescu, A., Theeuwen, S., van Dalen, R., Bosch, H., Wang, Tsung-Miau, Chen, Shih-Yuan, Jhuang, Yu-Fei, Cheng, Yung-WenYear:
2018
Language:
english
DOI:
10.1109/IPFA.2018.8452182
File:
PDF, 684 KB
english, 2018