A Plan-view TEM Specimen Preparation Method Using Focused Ion Beam
Lee, Lan-Hsuan, Yu, Chia-Hao, Hong, Yu-Ting, Wen, Cheng-YenVolume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192761700201x
Date:
July, 2017
File:
PDF, 479 KB
english, 2017