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Benchmarking the Reliability of the Consignments of Semiconductor Articles Using Electrostatic Discharges
Gorlov, M. I., Strogonov, A. V., Vinokurov, A. A.Volume:
54
Language:
english
Journal:
Russian Journal of Nondestructive Testing
DOI:
10.1134/S1061830918060025
Date:
June, 2018
File:
PDF, 298 KB
english, 2018