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Lifetime extension through Tj equalisation by use of intelligent gate driver with multi-chip power module
Brandelero, J., Ewanchuk, J., Degrenne, N., Mollov, S.Volume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.034
Date:
September, 2018
File:
PDF, 4.90 MB
english, 2018