Evaluation of interfacial structure of [111] and [001] oriented epitaxial NiO layers on GaAs substrate by non-destructive techniques
Singh, S.D., Das, Arijeet, Swami, M.K., Goutam, U.K., Sharma, R.K., Patel, H.S., Rai, S.K., Ganguli, TapasLanguage:
english
Journal:
Vacuum
DOI:
10.1016/j.vacuum.2018.10.030
Date:
October, 2018
File:
PDF, 733 KB
english, 2018