[IEEE 2018 IEEE International Conference on Electron...

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[IEEE 2018 IEEE International Conference on Electron Devices and Solid State Circuits (EDSSC) - Shenzhen, China (2018.6.6-2018.6.8)] 2018 IEEE International Conference on Electron Devices and Solid State Circuits (EDSSC) - Degradation Behaviors of Driving Thin-Film Transistors in Active-Matrix Organic Light-Emitting Diode Displays

Zhang, Meng, Yan, Yan, Zhou, Wei, Chen, Rongsheng, Deng, Sunbin, Wong, Man, Kwok, Hoi-Sing
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Year:
2018
Language:
english
DOI:
10.1109/EDSSC.2018.8487157
File:
PDF, 271 KB
english, 2018
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