[IEEE 2018 IEEE International Memory Workshop (IMW) - Kyoto (2018.5.13-2018.5.16)] 2018 IEEE International Memory Workshop (IMW) - The Analysis of Erase Voltage Variability in 70-nm Split-Gate Flash Memory Arrays
Tkachev, Yuri, Yoo, Jong-Won, Kotov, Alexander, Clark, Lawrence T., Holbert, Keith E.Year:
2018
Language:
english
DOI:
10.1109/imw.2018.8388855
File:
PDF, 2.87 MB
english, 2018