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Improvement in Thermomechanical Reliability of Low Cost Sn-Based BGA Interconnects by Cr Addition
Bang, Junghwan, Yu, Dong-Yurl, Yang, Ming, Ko, Yong-Ho, Yoon, Jeong-Won, Nishikawa, Hiroshi, Lee, Chang-WooVolume:
8
Language:
english
Journal:
Metals
DOI:
10.3390/met8080586
Date:
July, 2018
File:
PDF, 5.24 MB
english, 2018