Scanning TEM EBIC Imaging of Resistive Memory Switching...

Microscopy and Microanalysis 2018 / 08 Vol. 24; Iss. S1

Scanning TEM EBIC Imaging of Resistive Memory Switching Processes

Regan, B. C., Lodico, Jared, Hubbard, William A.
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Volume:
24
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927618009510
Date:
August, 2018
File:
PDF, 247 KB
english, 2018
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