Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode microwave cavity resonance spectroscopy
Beckers, J, van de Wetering, Ferdinandus Martinus Jozes Henricus, Platier, Bart, van Ninhuijs, Mark, Brussaard, Seth, Banine, Vadim Y, Luiten, O JomLanguage:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/1361-6463/aaeb17
Date:
October, 2018
File:
PDF, 2.27 MB
english, 2018