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Probing Crystal Dislocations in a Micrometer-Thick GaN Film by Modern High-Voltage Electron Microscopy
Sato, Kazuhisa, Yasuda, HidehiroVolume:
3
Language:
english
Journal:
ACS Omega
DOI:
10.1021/acsomega.8b02078
Date:
October, 2018
File:
PDF, 9.52 MB
english, 2018