Analysis of negative electron affinity InGaN photocathode...

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 2018 / 11 Vol. 36; Iss. 6

Analysis of negative electron affinity InGaN photocathode by temperature-programed desorption method

Kashima, Masahiro, Sato, Daiki, Koizumi, Atsushi, Nishitani, Tomohiro, Honda, Yoshio, Amano, Hiroshi, Iijima, Hokuto, Meguro, Takashi
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Volume:
36
Language:
english
Journal:
Journal of Vacuum Science & Technology B
DOI:
10.1116/1.5048061
Date:
November, 2018
File:
PDF, 1.99 MB
english, 2018
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