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Maximal Defect-Free Component in Nanoscale Crossbar Circuits Amidst Stuck-Open and Stuck-Closed Faults
Kule, Malay, Rahaman, Hafizur, Bhattacharya, Bhargab B.Language:
english
Journal:
Journal of Circuits, Systems and Computers
DOI:
10.1142/s0218126619501809
Date:
October, 2018
File:
PDF, 1.99 MB
english, 2018