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Fundamental frequencies of a torsional cantilever nano beam for dynamic atomic force microscopy (dAFM) in tapping mode
Moutlana, Malesela K., Adali, SarpLanguage:
english
Journal:
Microsystem Technologies
DOI:
10.1007/s00542-018-4166-x
Date:
October, 2018
File:
PDF, 2.09 MB
english, 2018