Probing surface electronic properties of a patterned...

Applied Surface Science 2019 / 02 Vol. 466

Probing surface electronic properties of a patterned conductive STO by reactive ion etching

Jin, Mi-Jin, Choe, Daeseong, Lee, Seung Youb, Park, Jungmin, Jo, Junhyeon, Oh, Inseon, Kim, Shin-Ik, Baek, Seung-Hyub, Jeon, Cheolho, Yoo, Jung-Woo
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Volume:
466
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2018.10.068
Date:
February, 2019
File:
PDF, 1.88 MB
english, 2019
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