[IEEE 2005 66th ARFTG Conference Measurement Conference...

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[IEEE 2005 66th ARFTG Conference Measurement Conference Digital Communication System Metrics (ARFTG) - Washington, DC, USA (2005.12.1-2005.12.2)] 2005 66th ARFTG Microwave Measurement Conference (ARFTG) - Hot S-parameter techniques: 6 = 4 + 2

Verspecht, Jan, Barataud, Denis, Teyssier, Jean-Pierre, Nebus, Jean-Michel
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Year:
2005
Language:
english
DOI:
10.1109/ARFTG.2005.8373119
File:
PDF, 258 KB
english, 2005
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