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[IEEE 2018 76th Device Research Conference (DRC) - Santa Barbara, CA, USA (2018.6.24-2018.6.27)] 2018 76th Device Research Conference (DRC) - Supercapacity (>1000 fJF/cm 2 ) charge release in a CVD-grown WSe2 FET incorporating a PEO: CsCI04 side gate
Heidarlou, M. Asghari, Jariwala, B., Paletti, P., Rouvimov, S., Robinsorr, J. A., Fullerton-Shirey, S. K., Seabaugh, A.Year:
2018
Language:
english
DOI:
10.1109/DRC.2018.8442277
File:
PDF, 1.24 MB
english, 2018