(Invited) Hydrogen-Related Trap States...

ECS Transactions 2018 / 07 Vol. 86; Iss. 11

(Invited) Hydrogen-Related Trap States Induced during Fabrication Process and Annealing Effects in Amorphous in-Ga-Zn-O Thin Film Transistors

Ochi, Mototaka, Hino, Aya, Goto, Hiroshi, Hayashi, Kazushi, Kugimiya, Toshihiro
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Volume:
86
Language:
english
Journal:
ECS Transactions
DOI:
10.1149/08611.0117ecst
Date:
July, 2018
File:
PDF, 328 KB
english, 2018
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