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[IEEE 2018 IEEE International Test Conference in Asia (ITC-Asia) - Harbin (2018.8.15-2018.8.17)] 2018 IEEE International Test Conference in Asia (ITC-Asia) - Implementing Design-for-Test Within a Tile-Based Design Methodology - Challenges and Solutions
Yellapragada, Venkat, Raman, Suresh, Shivaray, Banadappa, Romain, Luc, Nadeau-Dostie, Benoit, Keim, Martin, Cote, Jean-Francois, Au, Albert, Podichetty, Giri, Anbalan, AshokYear:
2018
Language:
english
DOI:
10.1109/ITC-Asia.2018.00018
File:
PDF, 530 KB
english, 2018