[IEEE 2018 41st International Spring Seminar on Electronics Technology (ISSE) - Zlatibor, Serbia (2018.5.16-2018.5.20)] 2018 41st International Spring Seminar on Electronics Technology (ISSE) - Thermal Cycle Testing of Printed Circuit Board Vias (Barrel Plates)
Dusek, Karel, Busek, David, Hrzina, Pavel, Sevcik, JanYear:
2018
Language:
english
DOI:
10.1109/isse.2018.8443608
File:
PDF, 709 KB
english, 2018