Local structural analysis of In-doped Bi 2...

Surface and Interface Analysis 2018 / 09

Local structural analysis of In-doped Bi 2 Se 3 topological insulator using X-ray fluorescence holography

Kimura, Koji, Hayashi, Koichi, Yashina, Lada V., Happo, Naohisa, Nishioka, Takumi, Yamamoto, Yuta, Ebisu, Yoshihiro, Ozaki, Toru, Hosokawa, Shinya, Matsushita, Tomohiro, Tajiri, Hiroo
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Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.6544
Date:
September, 2018
File:
PDF, 603 KB
english, 2018
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