Simultaneous high-resolution and wide-field microscopy with improved image sharpness using pseudo-thermal light source and Fourier Ptychography
Singh, Veena, Tayal, Shilpa, Mehta, Dalip SinghVolume:
178
Language:
english
Journal:
Optik
DOI:
10.1016/j.ijleo.2018.10.087
Date:
February, 2019
File:
PDF, 3.19 MB
english, 2019