Simultaneous high-resolution and wide-field microscopy with...

Simultaneous high-resolution and wide-field microscopy with improved image sharpness using pseudo-thermal light source and Fourier Ptychography

Singh, Veena, Tayal, Shilpa, Mehta, Dalip Singh
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Volume:
178
Language:
english
Journal:
Optik
DOI:
10.1016/j.ijleo.2018.10.087
Date:
February, 2019
File:
PDF, 3.19 MB
english, 2019
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