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On the impact of substrate electron injection on dynamic Ron in GaN-on-Si HEMTs
Pagnano, Dario, Longobardi, Giorgia, Udrea, Florin, Sun, Jinming, Imam, Mohamed, Garg, Reenu, Kim, Hyeongnam, Charles, AlainVolume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.102
Date:
September, 2018
File:
PDF, 1.51 MB
english, 2018