A Computationally Efficient Compact Model for Trap-Assisted...

IEEE Journal of the Electron Devices Society 2018 Vol. 6

A Computationally Efficient Compact Model for Trap-Assisted Carrier Transport Through Multi-Stack Gate Dielectrics of HKMG nMOS Transistors

Ojha, Apoorva, Mohapatra, Nihar R.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
6
Year:
2018
Language:
english
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/JEDS.2018.2871264
File:
PDF, 1.74 MB
english, 2018
Conversion to is in progress
Conversion to is failed