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Radiation robustness of normally-off GaN/HEMT power transistors (COTS)
Zerarka, M., Crepel, O.Volume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.148
Date:
September, 2018
File:
PDF, 3.18 MB
english, 2018