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STEM Imaging with Beam-Induced Hole and Secondary Electron Currents
Hubbard, William A., Mecklenburg, Matthew, Chan, Ho Leung, Regan, B. C.Volume:
10
Language:
english
Journal:
Physical Review Applied
DOI:
10.1103/PhysRevApplied.10.044066
Date:
October, 2018
File:
PDF, 1.32 MB
english, 2018