Gain and Scan Rate Dependence of Friction at the Nanoscale...

Journal of the Korean Physical Society 2018 / 8 Vol. 73; Iss. 3

Gain and Scan Rate Dependence of Friction at the Nanoscale Measured by Lateral Force Microscopy

Kim, Sunghyun, Kim, Suenne
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Volume:
73
Language:
english
Journal:
Journal of the Korean Physical Society
DOI:
10.3938/jkps.73.388
Date:
August, 2018
File:
PDF, 586 KB
english, 2018
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