(Invited) Resistive Memories (RRAM) Variability: Challenges and Solutions
Molas, Gabriel, Sassine, Gilbert, Nail, Cecile, Alfaro Robayo, Diego, Nodin, Jean-François, Cagli, Carlo, Coignus, Jean, Blaise, Philippe, Nowak, EtienneVolume:
86
Language:
english
Journal:
ECS Transactions
DOI:
10.1149/08603.0035ecst
Date:
July, 2018
File:
PDF, 1.05 MB
english, 2018