In Situ Synchrotron X-Ray Topography Observation of...

Materials Science Forum 2018 / 6 Vol. 924

In Situ Synchrotron X-Ray Topography Observation of Double-Ended Frank-Read Sources in PVT-Grown 4H-SiC Wafers

Yang, Yu, Guo, Jian Qiu, Raghothamachar, Balaji, Dudley, Michael, Weit, Swetlana, Danilewsky, Andreas N., McNally, Patrick J., Tanner, Brian R.
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Volume:
924
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.924.172
Date:
June, 2018
File:
PDF, 2.89 MB
english, 2018
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