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Implementing time resolved electron temperature capability at the NIF using a streak camera
Khan, S. F., Jarrott, L. C., Patel, P. K., Izumi, N., Ma, T., MacPhee, A. G., Hatch, B., Landen, O. L., Heinmiller, J., Kilkenny, J. D., Bradley, D. K.Volume:
89
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.5039382
Date:
October, 2018
File:
PDF, 1.25 MB
english, 2018