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A novel single-event-hardened charge pump using cascode voltage switch logic gates
Yang, Zhizhan, Xie, Xiaodong, Fan, Xue, Ren, YuboVolume:
91
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.10.016
Date:
December, 2018
File:
PDF, 2.48 MB
english, 2018