Studying the morphology, structure, band diagram of thin...

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Semiconductor Science and Technology 2018 / 10

Studying the morphology, structure, band diagram of thin GeSiSn films and their mid-infrared photoresponse

Timofeev, Vyacheslav Alexeyevich, Nikiforov, A I, Yakimov, Andrew I, Mashanov, Vladimir Ivanovich, Loshkarev, Ivan Dmitrievich, Bloshkin, Aleksei A, Kirienko, Victor V, Novikov, Vadim Aleksandrovich,
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Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/aaec3c
Date:
October, 2018
File:
PDF, 1.35 MB
english, 2018
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