![](/img/cover-not-exists.png)
Modeling the rate-dependent inelastic deformation behavior of porous polycrystalline silver films
Letz, S.A., Farooghian, A., Simon, F.B., Schletz, A.Volume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.084
Date:
September, 2018
File:
PDF, 1.10 MB
english, 2018