Advancements in X-Ray Analysis for Correlative Microscopy

Microscopy and Microanalysis 2018 / 08 Vol. 24; Iss. S1

Advancements in X-Ray Analysis for Correlative Microscopy

Gelb, Jeff, Lewis, Sylvia, Lau, SH, Kirz, Janos, Yun, Wenbing
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Volume:
24
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927618002283
Date:
August, 2018
File:
PDF, 1.46 MB
english, 2018
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