Investigation of the on-state behaviors of the variation of...

Journal of Semiconductors 2018 / 11 Vol. 39; Iss. 11

Investigation of the on-state behaviors of the variation of lateral width LDMOS device by simulation

Tang, Panpan, Wang, Ying, Meng, Xiongfei, Cui, Sufen
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
39
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/39/11/114007
Date:
November, 2018
File:
PDF, 950 KB
english, 2018
Conversion to is in progress
Conversion to is failed