![](/img/cover-not-exists.png)
Electrical characterization of epoxy-based molding compounds for next generation HV ICs in presence of moisture
Cornigli, D., Reggiani, S., Gnudi, A., Gnani, E., Baccarani, G., Fabiani, D., Varghese, D., Tuncer, E., Krishnan, S., Nguyen, L.Volume:
88-90
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.07.030
Date:
September, 2018
File:
PDF, 407 KB
english, 2018