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Molecular characterization of durum and common wheat recombinant lines carrying leaf rust resistance (Lr19)and yellow pigment(Y) genes fromLophopyrum ponticum
Wenjun Zhang, Adam J. Lukaszewski, Jim Kolmer, Marcelo A. Soria, Sham Goyal, Jorge DubcovskyVolume:
111
Language:
english
Pages:
10
DOI:
10.1007/s00122-005-2048-y
Date:
August, 2005
File:
PDF, 415 KB
english, 2005