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Marker-assisted characterization of Asian wheat lines for resistance toFusariumhead blight
Jian-Bin Yu, Gui-Hua Bai, Shi-Bin Cai, Tomohiro BanVolume:
113
Language:
english
Pages:
13
DOI:
10.1007/s00122-006-0297-z
Date:
July, 2006
File:
PDF, 247 KB
english, 2006