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Charge-Based Distortion Analysis of Nanoscale MOSFETs
Chicco, Francesco, Pezzotta, Alessandro, Enz, Christian C.Year:
2018
Language:
english
Journal:
IEEE Transactions on Circuits and Systems I: Regular Papers
DOI:
10.1109/TCSI.2018.2868387
File:
PDF, 1.77 MB
english, 2018