Analysis ofTaALMT1traces the transmission of aluminum resistance in cultivated common wheat (Triticum aestivumL.)
Harsh Raman, Peter R. Ryan, Rosy Raman, Benjamin J. Stodart, Kerong Zhang, Peter Martin, Rachel Wood, Takayuki Sasaki, Yoko Yamamoto, Michael Mackay, Diane M. Hebb, Emmanuel DelhaizeVolume:
116
Language:
english
Pages:
12
DOI:
10.1007/s00122-007-0672-4
Date:
February, 2008
File:
PDF, 505 KB
english, 2008