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[IEEE 2017 Symposium on VLSI Technology - Kyoto, Japan (2017.6.5-2017.6.8)] 2017 Symposium on VLSI Technology - New insight on the geometry dependence of BTI in 3D technologies based on experiments and modeling
Garros, Xavier, Laurent, Antoine, Barraud, Sylvain, Lacord, J., Faynot, Olivier, Ghibaudo, Gerard, Reimbold, GillesYear:
2017
Language:
english
DOI:
10.23919/vlsit.2017.7998152
File:
PDF, 1.94 MB
english, 2017