Residual Stresses in Cu/Ni Multilayer Thin Films Measured Using the Sin2ψ Method
McDonald, I. G., Moehlenkamp, W. M., Arola, D., Wang, J.Language:
english
Journal:
Experimental Mechanics
DOI:
10.1007/s11340-018-00447-2
Date:
November, 2018
File:
PDF, 1.79 MB
english, 2018