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Development of logical structure for multi-unit probabilistic safety assessment
Lim, Ho-Gon, Kim, Dong-San, Han, Sang Hoon, Yang, Joon EonLanguage:
english
Journal:
Nuclear Engineering and Technology
DOI:
10.1016/j.net.2018.10.012
Date:
October, 2018
File:
PDF, 613 KB
english, 2018