[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - In-situ FIB PVC to Speed up Fault Isolation of Floating Metal-Insulator-Metal Capacitor Failure
Siong, Lee Guan, YunGui, Li, Yong Qing, Renee Liu, WanRu, SunYear:
2018
Language:
english
DOI:
10.1109/IPFA.2018.8452573
File:
PDF, 4.88 MB
english, 2018