[IEEE 2018 IEEE 38th International Conference on Electronics and Nanotechnology (ELNANO) - Kiev (2018.4.24-2018.4.26)] 2018 IEEE 38th International Conference on Electronics and Nanotechnology (ELNANO) - Software Solution for Digital-Reflectometry of the Surface Structure of the Metal-Oxide Corrode Films
Matiushkin, Oleksandr O., Yershov, Roman D., Voytenko, Volodymyr P., Korolev, Aleksandr A.Year:
2018
Language:
english
DOI:
10.1109/ELNANO.2018.8477535
File:
PDF, 891 KB
english, 2018